Direct dock
style wafer probing allows for a higher bandwidth, increased pin density
and testing more devices in parallel. Direct dock probe cards also support the
growing movement of traditional final test to wafer probe which allows for
known good die (KGD) and reduced cost of ownership.
SV TCL &
Associates Probe Company China Japan Europe offers many probing solutions
aligning with this new testing paradigm including TrioTM traditional vertical,
LogicTouchTM MEMS vertical, and SpringTouchTM spring-pin technologies. Our
turnkey services are ideal for direct dock, we can handle your entire project
from PCB design to probe card assembly and everything in between.
Turnkey Services Available
- PCB/MLO Design & Fab
- Component Assembly
- Probe Card Assembly
- PCA
Applications Supported
- Digital
- SOC
- RF
Contact your SV TCL
Representative so we can help you find the right Direct Dock product for your
vertical testing needs.
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